US$ 649.50
Failure analysis and forensic investigation
✅ SKU SZ-CTV / Cat
Infrared Imaging
Surface texture and coarse feature examination where a wider line profile improves contrast
5µm Focal Length 20mm Field of View (Ø24 eyepiece) Ø2
Olympus LMPlan N 5X IR Objective | 0.10 NA Long Working Distance, Infinity Corrected leica ergo head Failure analysis and forensic investigationPremium 5 near infrared objective with extra long working distance ideal for IR imaging and silicon wafer inspection. 5 Magnification, NA 0. 13 Wide field of view with excellent depth of field for overview imaging. Near Infrared (IR) Optimized Corrected for 700 1600 nm wavelengths, ideal for silicon wafer inspection and IR imaging applications. Extra Long Working Distance (~23 mm) Exceptional clearance for thick specimens and probe based measurements.
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